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J R Abelson

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Physical Review Letters|June 21, 2001
Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperatureP M Voyles, J E Gerbi, M M Treacy, et al.
Nature Communications|July 5, 2012
Field-directed sputter sharpening for tailored probe materials and atomic-scale lithographyS W Schmucker, N Kumar, J R Abelson, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Physical Review Letters|June 21, 2001
Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperatureP M Voyles, J E Gerbi, M M Treacy, et al.
Nature Communications|July 5, 2012
Field-directed sputter sharpening for tailored probe materials and atomic-scale lithographyS W Schmucker, N Kumar, J R Abelson, et al.
Pageof 1