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J Rivory

Showing results (1-10 of 7) with videos related to

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Applied Optics|November 2, 2010
Synthesis of optical multilayer systems using genetic algorithmsS Martin, J Rivory, M Schoenauer
Applied Optics|December 15, 1986
Determination of thickness and optical constants of thin films from photometric and ellipsometric measurementsE Elizalde, J M Frigerio, J Rivory
Applied Optics|August 25, 2010
Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometryG P Larivière, J M Frigerio, J Rivory, et al.
Applied Optics|March 28, 2008
Making an omnidirectional reflectorB Gallas, S Fisson, E Charron, et al.
Optics Express|August 20, 2010
Silver square nanospirals mimic optical properties of U-shaped metamaterialsB Gallas, K Robbie, R Abdeddaïm, et al.
Applied Optics|November 25, 2010
Infrared ellipsometry investigation of SiO(x)N(y) thin films on siliconA Brunet-Bruneau, G Vuye, J M Frigerio, et al.
Applied Optics|December 4, 2010
Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurementsV Nguyen Van, A Brunet-Bruneau, S Fisson, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|November 2, 2010
Synthesis of optical multilayer systems using genetic algorithmsS Martin, J Rivory, M Schoenauer
Applied Optics|December 15, 1986
Determination of thickness and optical constants of thin films from photometric and ellipsometric measurementsE Elizalde, J M Frigerio, J Rivory
Applied Optics|August 25, 2010
Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometryG P Larivière, J M Frigerio, J Rivory, et al.
Applied Optics|March 28, 2008
Making an omnidirectional reflectorB Gallas, S Fisson, E Charron, et al.
Optics Express|August 20, 2010
Silver square nanospirals mimic optical properties of U-shaped metamaterialsB Gallas, K Robbie, R Abdeddaïm, et al.
Applied Optics|November 25, 2010
Infrared ellipsometry investigation of SiO(x)N(y) thin films on siliconA Brunet-Bruneau, G Vuye, J M Frigerio, et al.
Applied Optics|December 4, 2010
Determination of refractive-index profiles by a combination of visible and infrared ellipsometry measurementsV Nguyen Van, A Brunet-Bruneau, S Fisson, et al.
Pageof 1