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Applied Optics
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November 19, 2010
New approach to high-precision Fourier transform spectrometer design
J W Brault
Applied Optics
|
March 15, 1983
Line positions and strengths in the (001), (110), and (030) bands of HDO
R A Toth, J W Brault
Applied Optics
|
May 7, 2010
Double passing the Kiff Peak 1-m Fourier transform spectrometer
D E Jennings, R Hubbard, J W Brault
Applied Optics
|
January 15, 1986
Raman spectroscopy of gases with a Fourier transform spectrometer: the spectrum of D2
D E Jennings, A Weber, J W Brault
Applied Optics
|
November 19, 2010
Ghosts and artifacts in Fourier-transform spectrometry
R C Learner, A P Thorne, J W Brault
Applied Optics
|
August 20, 2010
Interference effects in reticon photodiode array detectors
G H Mount, R W Sanders, J W Brault
Applied Optics
|
April 17, 2010
Line positions and strengths of HDO in the 2400-3300-cm(-1) region
R A Toth, V D Gupta, J W Brault
Journal of Research of the National Institute of Standards and Technology
|
July 23, 2016
Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm
W Whaling, W H C Anderson, M T Carle, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 8) with videos related to
Sort By:
Page
of 1
Applied Optics
|
November 19, 2010
New approach to high-precision Fourier transform spectrometer design
J W Brault
Applied Optics
|
March 15, 1983
Line positions and strengths in the (001), (110), and (030) bands of HDO
R A Toth, J W Brault
Applied Optics
|
May 7, 2010
Double passing the Kiff Peak 1-m Fourier transform spectrometer
D E Jennings, R Hubbard, J W Brault
Applied Optics
|
January 15, 1986
Raman spectroscopy of gases with a Fourier transform spectrometer: the spectrum of D2
D E Jennings, A Weber, J W Brault
Applied Optics
|
November 19, 2010
Ghosts and artifacts in Fourier-transform spectrometry
R C Learner, A P Thorne, J W Brault
Applied Optics
|
August 20, 2010
Interference effects in reticon photodiode array detectors
G H Mount, R W Sanders, J W Brault
Applied Optics
|
April 17, 2010
Line positions and strengths of HDO in the 2400-3300-cm(-1) region
R A Toth, V D Gupta, J W Brault
Journal of Research of the National Institute of Standards and Technology
|
July 23, 2016
Argon I Lines Produced in a Hollow Cathode Source, 332 nm to 5865 nm
W Whaling, W H C Anderson, M T Carle, et al.
Page
of 1