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Ultramicroscopy|June 16, 2021
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopyIwona Jóźwik, Jacek Jagielski, Ewa Dumiszewska, et al.
Nanotechnology|November 3, 2012
Colloidal domain lithography in multilayers with perpendicular anisotropy: an experimental study and micromagnetic simulationsPiotr Kuświk, Iosif Sveklo, Bogdan Szymański, et al.
Nanoscale|June 17, 2025
Nanoscale defect formation in fcc Ni and low-Fe content Ni<sub><i>x</i></sub>Fe<sub>1-<i>x</i></sub> single crystals induced by self-ion irradiationEdyta Wyszkowska, Cyprian Mieszczyński, Amil Aligayev, et al.
Nanomaterials (Basel, Switzerland)|January 16, 2020
Round Robin into Best Practices for the Determination of Indentation Size EffectsAna Ruiz-Moreno, Peter Hähner, Lukasz Kurpaska, et al.
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