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Open Research Europe|August 30, 2023
The abTEM code: transmission electron microscopy from first principlesJacob Madsen, Toma SusiUltramicroscopy|March 28, 2021
ab initio description of bonding for transmission electron microscopyJacob Madsen, Timothy J Pennycook, Toma SusiJournal of Microscopy|March 21, 2025
Detecting charge transfer at defects in 2D materials with electron ptychographyChristoph Hofer, Jacob Madsen, Toma Susi, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2022
Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix DiagonalizationZhongbo Li, Harald Rose, Jacob Madsen, et al.Nano Letters|June 9, 2021
Atomic-Level Structural Engineering of Graphene on a Mesoscopic ScaleAlberto Trentino, Jacob Madsen, Andreas Mittelberger, et al.Small (Weinheim an Der Bergstrasse, Germany)|June 3, 2021
Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D MaterialsMichael J Zachman, Jacob Madsen, Xiang Zhang, et al.Chemical Communications (Cambridge, England)|October 19, 2022
Identifying and manipulating single atoms with scanning transmission electron microscopyToma SusiJournal of Microscopy|March 29, 2025
Quantifying phase magnitudes of open-source focused-probe 4D-STEM ptychography reconstructionsToma SusiThe Journal of Physical Chemistry. C, Nanomaterials and Interfaces|August 6, 2021
Mechanism of Electron-Beam Manipulation of Single-Dopant Atoms in SiliconAlexander Markevich, Bethany M Hudak, Jacob Madsen, et al.Pageof 16