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Jacques Cazaux

Showing results (1-10 of 5) with videos related to

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Scanning|October 12, 2004
Charging in scanning electron microscopy "from inside and outside"Jacques Cazaux
Ultramicroscopy|August 12, 2008
On some contrast reversals in SEM: application to metal/insulator systemsJacques Cazaux
Ultramicroscopy|January 12, 2010
Material contrast in SEM: Fermi energy and work function effectsJacques Cazaux
Journal of Electron Microscopy|August 9, 2012
From the physics of secondary electron emission to image contrasts in scanning electron microscopyJacques Cazaux
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
About the mechanisms of charging in EPMA, SEM, and ESEM with their time evolutionJacques Cazaux
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Scanning|October 12, 2004
Charging in scanning electron microscopy "from inside and outside"Jacques Cazaux
Ultramicroscopy|August 12, 2008
On some contrast reversals in SEM: application to metal/insulator systemsJacques Cazaux
Ultramicroscopy|January 12, 2010
Material contrast in SEM: Fermi energy and work function effectsJacques Cazaux
Journal of Electron Microscopy|August 9, 2012
From the physics of secondary electron emission to image contrasts in scanning electron microscopyJacques Cazaux
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 29, 2009
About the mechanisms of charging in EPMA, SEM, and ESEM with their time evolutionJacques Cazaux
Pageof 1