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Evidence-Based Complementary and Alternative Medicine : Ecam|April 8, 2020
Association of Cost and Medical Service Satisfaction with Korean and Conventional Medicine Use before and after Surgery in Postsurgical Patients: A Questionnaire Survey of Korean Patients with Postsurgical Pain Visiting Korean Medicine HospitalsKi-Beom Lee, Yoon Jae Lee, Me-Riong Kim, et al.
Food Science and Biotechnology|October 1, 2020
New caryophyllene-type sesquiterpene and flavonol tetraglycoside with sixteen known compounds from sword bean (Canavalia gladiata)Hyun Jeong An, Eun Hee Kim, Hyoung Jae Lee, et al.
The Angle Orthodontist|January 12, 2021
Evaluation of automated cephalometric analysis based on the latest deep learning methodHye-Won Hwang, Jun-Ho Moon, Min-Gyu Kim, et al.
Annals of Rehabilitation Medicine|September 7, 2022
Quantitative Analysis in Cervical Spinal Cord Injury Patients Using Diffusion Tensor Imaging and TractographyGeun Seok Park, Tae Uk Kim, Seong Jae Lee, et al.
Journal of Orthopaedic Surgery (Hong Kong)|October 31, 2022
Should cervicothoracic junctions be avoided in long cervical posterior fusion surgery? Analysis of clinical and radiologic outcomes over two yearsJung Jae Lee, Jin Hoon Park, Young Gyu Oh, et al.
International Journal of Implant Dentistry|October 4, 2022
The effect of loading time on marginal bone change of implants immediately placed after extraction: a retrospective studySung-Jae Lee, Euy-Hyun Kim, Dong-Keon Lee, et al.
Materials (Basel, Switzerland)|December 24, 2021
X-ray CT Analysis of the Cross-Section of a 3D-Printed Deformed LayerHo-Jae Lee, Eun-A Seo, Won-Woo Kim, et al.
Sensors (Basel, Switzerland)|February 15, 2022
Crossing Frequency Method Applicable to Intermediate Pressure Plasma Diagnostics Using the Cutoff ProbeSi-Jun Kim, Jang-Jae Lee, Young-Seok Lee, et al.
NMC Case Report Journal|October 18, 2018
Lumbar Intradiscal Invaginated Inferior Vena Cava AneurysmSeung Young Jeong, Jin Uk Kim, Soo Yong Park, et al.
Optics Express|April 27, 2022
Noise optimization of single-photon avalanche diodes fabricated in 110 nm CMOS image sensor technologyWon-Yong Ha, Eunsung Park, Byungchoul Park, et al.
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