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JaeGwan Chung

Showing results (1-10 of 13) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 8, 2013
Electron energy loss spectroscopy characterization of TANOS (TaN/Al₂O₃/Si₃N₄/SiO₂/Si) stacksJucheol Park, Sung Heo, JaeGwan Chung, et al.
ACS Applied Materials & Interfaces|June 21, 2017
Impact of Interface Mixing on the Performance of Solution Processed Organic Light Emitting Diodes-Impedance and Ultraviolet Photoelectron Spectroscopy StudyDong A Ahn, Seungjun Lee, Jaegwan Chung, et al.
Nanotechnology|October 27, 2015
Direct analytical method of contact position effects on the energy-level alignments at organic semiconductor/electrode interfaces using photoemission spectroscopy combined with Ar gas cluster ion beam sputteringDong-Jin Yun, JaeGwan Chung, Seong Heon Kim, et al.
Scientific Reports|November 15, 2017
Effect of Si on the Energy Band Gap Modulation and Performance of Silicon Indium Zinc Oxide Thin-Film TransistorsJun Young Choi, Keun Heo, Kyung-Sang Cho, et al.
Nanotechnology|March 11, 2016
Study on the disparate transition behaviors of the electrical/physical properties in PEDOT:PSS film depending on solvent species under a follow-up solution-treatment processDong-Jin Yun, Jung-Hwa Kim, Seong Heon Kim, et al.
Scientific Reports|October 7, 2021
Facile and versatile ligand analysis method of colloidal quantum dotJin Hae Kim, Hyokeun Park, Tae-Gon Kim, et al.
Physical Chemistry Chemical Physics : PCCP|January 6, 2018
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
ACS Applied Materials & Interfaces|September 28, 2020
In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron SpectroscopyDong-Jin Yun, Youngjun Yun, Jiyoul Lee, et al.
Physical Chemistry Chemical Physics : PCCP|December 12, 2017
Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
Journal of Nanoscience and Nanotechnology|November 22, 2011
Effects of interfacial layer on characteristics of TiN/ZrO2 structuresYounsoo Kim, Sang Yeol Kang, Jae Hyoung Choi, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 8, 2013
Electron energy loss spectroscopy characterization of TANOS (TaN/Al₂O₃/Si₃N₄/SiO₂/Si) stacksJucheol Park, Sung Heo, JaeGwan Chung, et al.
ACS Applied Materials & Interfaces|June 21, 2017
Impact of Interface Mixing on the Performance of Solution Processed Organic Light Emitting Diodes-Impedance and Ultraviolet Photoelectron Spectroscopy StudyDong A Ahn, Seungjun Lee, Jaegwan Chung, et al.
Nanotechnology|October 27, 2015
Direct analytical method of contact position effects on the energy-level alignments at organic semiconductor/electrode interfaces using photoemission spectroscopy combined with Ar gas cluster ion beam sputteringDong-Jin Yun, JaeGwan Chung, Seong Heon Kim, et al.
Scientific Reports|November 15, 2017
Effect of Si on the Energy Band Gap Modulation and Performance of Silicon Indium Zinc Oxide Thin-Film TransistorsJun Young Choi, Keun Heo, Kyung-Sang Cho, et al.
Nanotechnology|March 11, 2016
Study on the disparate transition behaviors of the electrical/physical properties in PEDOT:PSS film depending on solvent species under a follow-up solution-treatment processDong-Jin Yun, Jung-Hwa Kim, Seong Heon Kim, et al.
Scientific Reports|October 7, 2021
Facile and versatile ligand analysis method of colloidal quantum dotJin Hae Kim, Hyokeun Park, Tae-Gon Kim, et al.
Physical Chemistry Chemical Physics : PCCP|January 6, 2018
Correction: Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
ACS Applied Materials & Interfaces|September 28, 2020
In-Depth Investigation of the Correlation between Organic Semiconductor Orientation and Energy-Level Alignment Using In Situ Photoelectron SpectroscopyDong-Jin Yun, Youngjun Yun, Jiyoul Lee, et al.
Physical Chemistry Chemical Physics : PCCP|December 12, 2017
Direct characterization of graphene doping state by in situ photoemission spectroscopy with Ar gas cluster ion beam sputteringDong-Jin Yun, Seyun Kim, Changhoon Jung, et al.
Journal of Nanoscience and Nanotechnology|November 22, 2011
Effects of interfacial layer on characteristics of TiN/ZrO2 structuresYounsoo Kim, Sang Yeol Kang, Jae Hyoung Choi, et al.
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