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James C Gallagher

Showing results (1-10 of 6) with videos related to

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Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|March 5, 2009
Experimental observation of soliton propagation and annihilation in a hydromechanical array of one-way coupled oscillatorsJohn F Lindner, Kelly M Patton, Patrick M Odenthal, et al.
Scientific Reports|March 29, 2024
Detecting defects that reduce breakdown voltage using machine learning and optical profilometryJames C Gallagher, Michael A Mastro, Alan G Jacobs, et al.
Scientific Reports|January 14, 2022
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniquesJames C Gallagher, Mona A Ebrish, Matthew A Porter, et al.
Scientific Reports|February 27, 2023
Using machine learning with optical profilometry for GaN wafer screeningJames C Gallagher, Michael A Mastro, Mona A Ebrish, et al.
Nano Letters|January 2, 2024
Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon CarbideScott G Criswell, Nadeemullah A Mahadik, James C Gallagher, et al.
Physical Review. B|March 15, 2024
Room Temperature Skyrmions in Strain-Engineered FeGe thin filmsSujan Budhathoki, Arjun Sapkota, Ka Ming Law, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|March 5, 2009
Experimental observation of soliton propagation and annihilation in a hydromechanical array of one-way coupled oscillatorsJohn F Lindner, Kelly M Patton, Patrick M Odenthal, et al.
Scientific Reports|March 29, 2024
Detecting defects that reduce breakdown voltage using machine learning and optical profilometryJames C Gallagher, Michael A Mastro, Alan G Jacobs, et al.
Scientific Reports|January 14, 2022
Optimizing performance and yield of vertical GaN diodes using wafer scale optical techniquesJames C Gallagher, Mona A Ebrish, Matthew A Porter, et al.
Scientific Reports|February 27, 2023
Using machine learning with optical profilometry for GaN wafer screeningJames C Gallagher, Michael A Mastro, Mona A Ebrish, et al.
Nano Letters|January 2, 2024
Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon CarbideScott G Criswell, Nadeemullah A Mahadik, James C Gallagher, et al.
Physical Review. B|March 15, 2024
Room Temperature Skyrmions in Strain-Engineered FeGe thin filmsSujan Budhathoki, Arjun Sapkota, Ka Ming Law, et al.
Pageof 1