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James Fait

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Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD DiffractometersSusan K Byram, Charles F Campana, James Fait, et al.
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Pageof 1
Journal of Research of the National Institute of Standards and Technology|January 1, 1996
Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD DiffractometersSusan K Byram, Charles F Campana, James Fait, et al.
Pageof 1