Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

James P Cline

Showing results (1-10 of 17) with videos related to

Pageof 2
Sort By:
Acta Crystallographica. Section A, Foundations and Advances|December 22, 2018
Model-independent extraction of the shapes and Fourier transforms from patterns of partially overlapped peaks with extended tailsMarcus H Mendenhall, James P Cline
Journal of Applied Crystallography|March 14, 2020
The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysisMarcus H Mendenhall, David Black, James P Cline
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line ProfilesMarcus H Mendenhall, Katharine Mullen, James P Cline
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Bayesian Inference of Nanoparticle-Broadened X-Ray Line ProfilesNicholas Armstrong, Walter Kalceff, James P Cline, et al.
Metrologia|June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometerMarcus H Mendenhall, Albert Henins, Donald Windover, et al.
Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theoryMarcus H Mendenhall, David Black, Donald Windover, et al.
The Review of Scientific Instruments|October 3, 2023
The NIST silicon lattice comparator upgradeMarcus H Mendenhall, James P Cline, Csilla I Szabo, et al.
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference MaterialsJames P Cline, Marcus H Mendenhall, David Black, et al.
Powder Diffraction|November 19, 2021
Certification of SRM 640f line position and line shape standard for powder diffractionDavid R Black, Marcus H Mendenhall, Albert Henins, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|February 28, 2020
The Molybdenum K-shell X-ray Emission SpectrumMarcus H Mendenhall, Lawrence T Hudson, Csilla I Szabo, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Acta Crystallographica. Section A, Foundations and Advances|December 22, 2018
Model-independent extraction of the shapes and Fourier transforms from patterns of partially overlapped peaks with extended tailsMarcus H Mendenhall, James P Cline
Journal of Applied Crystallography|March 14, 2020
The optics of focusing bent-crystal monochromators on X-ray powder diffractometers with application to lattice parameter determination and microstructure analysisMarcus H Mendenhall, David Black, James P Cline
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line ProfilesMarcus H Mendenhall, Katharine Mullen, James P Cline
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Bayesian Inference of Nanoparticle-Broadened X-Ray Line ProfilesNicholas Armstrong, Walter Kalceff, James P Cline, et al.
Metrologia|June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometerMarcus H Mendenhall, Albert Henins, Donald Windover, et al.
Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theoryMarcus H Mendenhall, David Black, Donald Windover, et al.
The Review of Scientific Instruments|October 3, 2023
The NIST silicon lattice comparator upgradeMarcus H Mendenhall, James P Cline, Csilla I Szabo, et al.
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference MaterialsJames P Cline, Marcus H Mendenhall, David Black, et al.
Powder Diffraction|November 19, 2021
Certification of SRM 640f line position and line shape standard for powder diffractionDavid R Black, Marcus H Mendenhall, Albert Henins, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|February 28, 2020
The Molybdenum K-shell X-ray Emission SpectrumMarcus H Mendenhall, Lawrence T Hudson, Csilla I Szabo, et al.
Pageof 2