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James P Cline

Showing results (11-20 of 17) with videos related to

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Journal of Research of the National Institute of Standards and Technology|March 12, 2024
The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission SpectraCsilla I Szabo, James P Cline, Albert Henins, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|June 23, 2011
Addressing the amorphous content issue in quantitative phase analysis: the certification of NIST standard reference material 676aJames P Cline, Robert B Von Dreele, Ryan Winburn, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrumMarcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Powder Diffraction|December 14, 2020
Certification of Standard Reference Material 660c for powder diffractionDavid R Black, Marcus H Mendenhall, Craig M Brown, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
The Lattice Spacing Variability of Intrinsic Float-Zone SiliconErnest G Kessler, Csilla I Szabo, James P Cline, et al.
Powder Diffraction|April 19, 2019
Certification of Standard Reference Material 1879b Respirable CristobaliteDavid R Black, Marcus H Mendenhall, Pamela S Whitfield, et al.
Journal of Research of the National Institute of Standards and Technology|July 31, 2024
The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size AnalysisJames P Cline, Marcus H Mendenhall, Joseph J Ritter, et al.
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Showing results (11-20 of 17) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 17 results.
Journal of Research of the National Institute of Standards and Technology|March 12, 2024
The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission SpectraCsilla I Szabo, James P Cline, Albert Henins, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|June 23, 2011
Addressing the amorphous content issue in quantitative phase analysis: the certification of NIST standard reference material 676aJames P Cline, Robert B Von Dreele, Ryan Winburn, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrumMarcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Powder Diffraction|December 14, 2020
Certification of Standard Reference Material 660c for powder diffractionDavid R Black, Marcus H Mendenhall, Craig M Brown, et al.
Journal of Research of the National Institute of Standards and Technology|December 8, 2021
The Lattice Spacing Variability of Intrinsic Float-Zone SiliconErnest G Kessler, Csilla I Szabo, James P Cline, et al.
Powder Diffraction|April 19, 2019
Certification of Standard Reference Material 1879b Respirable CristobaliteDavid R Black, Marcus H Mendenhall, Pamela S Whitfield, et al.
Journal of Research of the National Institute of Standards and Technology|July 31, 2024
The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size AnalysisJames P Cline, Marcus H Mendenhall, Joseph J Ritter, et al.
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