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Jan Oliver Oelerich

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Ultramicroscopy|November 21, 2017
Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulationsLennart Duschek, Andreas Beyer, Jan Oliver Oelerich, et al.
Journal of Microscopy|September 2, 2017
Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEMAndreas Beyer, Lennart Duschek, Jürgen Belz, et al.
Ultramicroscopy|March 24, 2017
STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimensJan Oliver Oelerich, Lennart Duschek, Jürgen Belz, et al.
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Showing results (1-10 of 3) with videos related to

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Pageof 1
Ultramicroscopy|November 21, 2017
Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulationsLennart Duschek, Andreas Beyer, Jan Oliver Oelerich, et al.
Journal of Microscopy|September 2, 2017
Surface relaxation of strained Ga(P,As)/GaP heterostructures investigated by HAADF STEMAndreas Beyer, Lennart Duschek, Jürgen Belz, et al.
Ultramicroscopy|March 24, 2017
STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimensJan Oliver Oelerich, Lennart Duschek, Jürgen Belz, et al.
Pageof 1