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Janghwan Cha

Showing results (1-10 of 12) with videos related to

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ACS Omega|September 15, 2025
Selectively Adsorbed CO and O<sub>2</sub> on Transition-Metal-Incorporated PorphyrinJanghwan Cha, Hoonkyung Lee, Suklyun Hong
Physical Chemistry Chemical Physics : PCCP|October 2, 2018
Mixed-dimensional 2D/3D heterojunctions between MoS<sub>2</sub> and Si(100)Hyunsoo Choi, Kyung-Ah Min, Janghwan Cha, et al.
Physical Review Letters|April 7, 2010
Inaccuracy of density functional theory calculations for dihydrogen binding energetics onto Ca cation centersJanghwan Cha, Seokho Lim, Cheol Ho Choi, et al.
Nanomaterials (Basel, Switzerland)|November 27, 2021
Effect of Point Defects on Electronic Structure of Monolayer GeSHyeong-Kyu Choi, Janghwan Cha, Chang-Gyu Choi, et al.
ACS Applied Materials & Interfaces|February 27, 2019
Black Phosphorus-IGZO van der Waals Diode with Low-Resistivity Metal ContactsGhulam Dastgeer, Muhammad Farooq Khan, Janghwan Cha, et al.
Science Advances|March 18, 2020
One-dimensional hexagonal boron nitride conducting channelHyo Ju Park, Janghwan Cha, Min Choi, et al.
Scientific Reports|August 30, 2018
Visualizing Degradation of Black Phosphorus Using Liquid CrystalsBilal Abbas Naqvi, Muhammad Arslan Shehzad, Janghwan Cha, et al.
ACS Applied Materials & Interfaces|March 27, 2018
Temperature-Dependent and Gate-Tunable Rectification in a Black Phosphorus/WS<sub>2</sub> van der Waals Heterojunction DiodeGhulam Dastgeer, Muhammad Farooq Khan, Ghazanfar Nazir, et al.
ACS Applied Materials & Interfaces|October 8, 2025
Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe<sub>2</sub>: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition"Hansung Kim, Janghwan Cha, Jong Hyeok Seo, et al.
ACS Applied Materials & Interfaces|August 13, 2025
Accurate Assessments of the Electronic Structures of Ultrathin PtSe<sub>2</sub>: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor TransitionHansung Kim, Janghwan Cha, Jong Hyeok Seo, et al.
Pageof 2

Showing results (1-10 of 12) with videos related to

Sort By:
Pageof 2
ACS Omega|September 15, 2025
Selectively Adsorbed CO and O<sub>2</sub> on Transition-Metal-Incorporated PorphyrinJanghwan Cha, Hoonkyung Lee, Suklyun Hong
Physical Chemistry Chemical Physics : PCCP|October 2, 2018
Mixed-dimensional 2D/3D heterojunctions between MoS<sub>2</sub> and Si(100)Hyunsoo Choi, Kyung-Ah Min, Janghwan Cha, et al.
Physical Review Letters|April 7, 2010
Inaccuracy of density functional theory calculations for dihydrogen binding energetics onto Ca cation centersJanghwan Cha, Seokho Lim, Cheol Ho Choi, et al.
Nanomaterials (Basel, Switzerland)|November 27, 2021
Effect of Point Defects on Electronic Structure of Monolayer GeSHyeong-Kyu Choi, Janghwan Cha, Chang-Gyu Choi, et al.
ACS Applied Materials & Interfaces|February 27, 2019
Black Phosphorus-IGZO van der Waals Diode with Low-Resistivity Metal ContactsGhulam Dastgeer, Muhammad Farooq Khan, Janghwan Cha, et al.
Science Advances|March 18, 2020
One-dimensional hexagonal boron nitride conducting channelHyo Ju Park, Janghwan Cha, Min Choi, et al.
Scientific Reports|August 30, 2018
Visualizing Degradation of Black Phosphorus Using Liquid CrystalsBilal Abbas Naqvi, Muhammad Arslan Shehzad, Janghwan Cha, et al.
ACS Applied Materials & Interfaces|March 27, 2018
Temperature-Dependent and Gate-Tunable Rectification in a Black Phosphorus/WS<sub>2</sub> van der Waals Heterojunction DiodeGhulam Dastgeer, Muhammad Farooq Khan, Ghazanfar Nazir, et al.
ACS Applied Materials & Interfaces|October 8, 2025
Correction to "Accurate Assessments of the Electronic Structures of Ultrathin PtSe<sub>2</sub>: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor Transition"Hansung Kim, Janghwan Cha, Jong Hyeok Seo, et al.
ACS Applied Materials & Interfaces|August 13, 2025
Accurate Assessments of the Electronic Structures of Ultrathin PtSe<sub>2</sub>: Bandgap Quantification and Critical Thickness for the Metal-Semiconductor TransitionHansung Kim, Janghwan Cha, Jong Hyeok Seo, et al.
Pageof 2