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Beilstein Journal of Nanotechnology|February 2, 2017
Noise in NC-AFM measurements with significant tip-sample interactionJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.Beilstein Journal of Nanotechnology|April 26, 2013
Determining cantilever stiffness from thermal noiseJannis Lübbe, Matthias Temmen, Philipp Rahe, et al.Beilstein Journal of Nanotechnology|February 13, 2013
Thermal noise limit for ultra-high vacuum noncontact atomic force microscopyJannis Lübbe, Matthias Temmen, Sebastian Rode, et al.Pageof 1