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Optics Express
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June 6, 2019
Mechanically scanned interference pattern structured illumination imaging
Jarom Jackson, Dallin Durfee
Optics Express
|
December 25, 2015
Laser wavelength metrology with color sensor chips
Tyler B Jones, Nils Otterstrom, Jarom Jackson, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Optics Express
|
June 6, 2019
Mechanically scanned interference pattern structured illumination imaging
Jarom Jackson, Dallin Durfee
Optics Express
|
December 25, 2015
Laser wavelength metrology with color sensor chips
Tyler B Jones, Nils Otterstrom, Jarom Jackson, et al.
Page
of 1