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Ultramicroscopy|December 18, 2020
Integrated correction of optical distortions for global HR-EBSD techniquesClément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, et al.
Microscopy Research and Technique|July 23, 2026
Development of a Pixelated STEM-In-SEM Detector for Microstructural Feature CharacterizationJulien Aubourg, Emmanuel Bouzy, Jean-Jacques Fundenberger, et al.
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