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Optics Express
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August 20, 2008
Optical chirality without optical activity: How surface plasmons give a twist to light
Aurelien Drezet, Cyriaque Genet, Jean-Yves Laluet, et al.
Physical Review Letters
|
January 15, 2011
Surface plasmon mode steering and negative refraction
Benedikt Stein, Jean-Yves Laluet, Eloïse Devaux, et al.
Nano Letters
|
March 14, 2007
Wavelength selective nanophotonic components utilizing channel plasmon polaritons
Valentyn S Volkov, Sergey I Bozhevolnyi, Eloïse Devaux, et al.
Nature
|
March 24, 2006
Channel plasmon subwavelength waveguide components including interferometers and ring resonators
Sergey I Bozhevolnyi, Valentyn S Volkov, Eloïse Devaux, et al.
Optics Express
|
October 14, 2010
Refractive micro-optical elements for surface plasmons: from classical to gradient index optics
Eloïse Devaux, Jean-Yves Laluet, Benedikt Stein, et al.
Materials (Basel, Switzerland)
|
June 20, 2019
X-ray Computed Tomography for Characterization of Expanded Polystyrene (EPS) Foam
Redouane Meftah, Jeroen Van Stappen, Sylvain Berger, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Optics Express
|
August 20, 2008
Optical chirality without optical activity: How surface plasmons give a twist to light
Aurelien Drezet, Cyriaque Genet, Jean-Yves Laluet, et al.
Physical Review Letters
|
January 15, 2011
Surface plasmon mode steering and negative refraction
Benedikt Stein, Jean-Yves Laluet, Eloïse Devaux, et al.
Nano Letters
|
March 14, 2007
Wavelength selective nanophotonic components utilizing channel plasmon polaritons
Valentyn S Volkov, Sergey I Bozhevolnyi, Eloïse Devaux, et al.
Nature
|
March 24, 2006
Channel plasmon subwavelength waveguide components including interferometers and ring resonators
Sergey I Bozhevolnyi, Valentyn S Volkov, Eloïse Devaux, et al.
Optics Express
|
October 14, 2010
Refractive micro-optical elements for surface plasmons: from classical to gradient index optics
Eloïse Devaux, Jean-Yves Laluet, Benedikt Stein, et al.
Materials (Basel, Switzerland)
|
June 20, 2019
X-ray Computed Tomography for Characterization of Expanded Polystyrene (EPS) Foam
Redouane Meftah, Jeroen Van Stappen, Sylvain Berger, et al.
Page
of 1