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The Review of Scientific Instruments|March 6, 2019
A steady-state thermoreflectance method to measure thermal conductivityJeffrey L Braun, David H Olson, John T Gaskins, et al.
The Review of Scientific Instruments|July 2, 2025
A thermo-optical plane source method to measure thermal conductivityJeffrey L Braun, Bryan N Baines, John T Gaskins, et al.
The Journal of Chemical Physics|May 17, 2019
Thin Ti adhesion layer breaks bottleneck to hot hole relaxation in Au filmsXin Zhou, Marina V Tokina, John A Tomko, et al.
The Review of Scientific Instruments|June 3, 2017
Localized thin film damage sourced and monitored via pump-probe modulated thermoreflectanceBrian F Donovan, John A Tomko, Ashutosh Giri, et al.
Advanced Materials (Deerfield Beach, Fla.)|October 29, 2018
Charge-Induced Disorder Controls the Thermal Conductivity of Entropy-Stabilized OxidesJeffrey L Braun, Christina M Rost, Mina Lim, et al.
Advanced Materials (Deerfield Beach, Fla.)|September 18, 2018
Interfacial Defect Vibrations Enhance Thermal Transport in Amorphous Multilayers with Ultrahigh Thermal Boundary ConductanceAshutosh Giri, Sean W King, William A Lanford, et al.
The Review of Scientific Instruments|July 10, 2021
Thermal conductivity measurements of sub-surface buried substrates by steady-state thermoreflectanceMd Shafkat Bin Hoque, Yee Rui Koh, Kiumars Aryana, et al.
ACS Applied Materials & Interfaces|June 4, 2020
Bulk-like Intrinsic Phonon Thermal Conductivity of Micrometer-Thick AlN FilmsYee Rui Koh, Zhe Cheng, Abdullah Mamun, et al.
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