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Jen-Chun Lee

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Sensors (Basel, Switzerland)|October 2, 2020
A Study of Defect Detection Techniques for Metallographic ImagesWei-Hung Wu, Jen-Chun Lee, Yi-Ming Wang
Science Progress|February 24, 2024
Image deblurring by multi-scale modified U-Net using dilated convolutionXiao-Pei Shi, Song-Yih Lin, Min-Lang Yang, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Sensors (Basel, Switzerland)|October 2, 2020
A Study of Defect Detection Techniques for Metallographic ImagesWei-Hung Wu, Jen-Chun Lee, Yi-Ming Wang
Science Progress|February 24, 2024
Image deblurring by multi-scale modified U-Net using dilated convolutionXiao-Pei Shi, Song-Yih Lin, Min-Lang Yang, et al.
Pageof 1