Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Jens Klier

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Optics Express|October 14, 2022
Phase-sensitive terahertz upconversion detectionTobias Pfeiffer, Jens Klier, Georg von Freymann, et al.
Optics Express|April 15, 2010
A pulsed THz imaging system with a line focus and a balanced 1-D detection scheme with two industrial CCD line-scan camerasChristian Wiegand, Michael Herrmann, Sebastian Bachtler, et al.
Optics Express|May 27, 2018
Terahertz thickness determination with interferometric vibration correction for industrial applicationsTobias Pfeiffer, Stefan Weber, Jens Klier, et al.
Optics Express|December 19, 2025
Simultaneous charge carrier density mapping of SiC epilayers and substrates with terahertz time-domain spectroscopyJoshua Hennig, Jens Klier, Stefan Duran, et al.
Optics Express|June 11, 2024
Wide-range resistivity characterization of semiconductors with terahertz time-domain spectroscopyJoshua Hennig, Jens Klier, Stefan Duran, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|October 14, 2022
Phase-sensitive terahertz upconversion detectionTobias Pfeiffer, Jens Klier, Georg von Freymann, et al.
Optics Express|April 15, 2010
A pulsed THz imaging system with a line focus and a balanced 1-D detection scheme with two industrial CCD line-scan camerasChristian Wiegand, Michael Herrmann, Sebastian Bachtler, et al.
Optics Express|May 27, 2018
Terahertz thickness determination with interferometric vibration correction for industrial applicationsTobias Pfeiffer, Stefan Weber, Jens Klier, et al.
Optics Express|December 19, 2025
Simultaneous charge carrier density mapping of SiC epilayers and substrates with terahertz time-domain spectroscopyJoshua Hennig, Jens Klier, Stefan Duran, et al.
Optics Express|June 11, 2024
Wide-range resistivity characterization of semiconductors with terahertz time-domain spectroscopyJoshua Hennig, Jens Klier, Stefan Duran, et al.
Pageof 1