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Jens Lenaerts

Showing results (1-10 of 6) with videos related to

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Rapid Communications in Mass Spectrometry : RCM|September 5, 2003
Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometryJens Lenaerts, Luc Van Vaeck, Renaat Gijbels
Journal of the American Society for Mass Spectrometry|November 14, 2006
In situ temperature-time effect on MetA-S-SIMSRoel De Mondt, Luc Van Vaeck, Jens Lenaerts
Rapid Communications in Mass Spectrometry : RCM|February 3, 2004
Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometryJens Lenaerts, Luc Van Vaeck, Renaat Gijbels, et al.
Rapid Communications in Mass Spectrometry : RCM|January 31, 2006
Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systemsRoel De Mondt, Luc Van Vaeck, Jens Lenaerts, et al.
Analytical and Bioanalytical Chemistry|February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodologyRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Rapid Communications in Mass Spectrometry : RCM|April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ionsRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Rapid Communications in Mass Spectrometry : RCM|September 5, 2003
Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometryJens Lenaerts, Luc Van Vaeck, Renaat Gijbels
Journal of the American Society for Mass Spectrometry|November 14, 2006
In situ temperature-time effect on MetA-S-SIMSRoel De Mondt, Luc Van Vaeck, Jens Lenaerts
Rapid Communications in Mass Spectrometry : RCM|February 3, 2004
Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometryJens Lenaerts, Luc Van Vaeck, Renaat Gijbels, et al.
Rapid Communications in Mass Spectrometry : RCM|January 31, 2006
Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systemsRoel De Mondt, Luc Van Vaeck, Jens Lenaerts, et al.
Analytical and Bioanalytical Chemistry|February 26, 2009
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodologyRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Rapid Communications in Mass Spectrometry : RCM|April 11, 2008
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ionsRoel De Mondt, Luc Van Vaeck, Andreas Heile, et al.
Pageof 1