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Surface and Interface Analysis : SIA
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October 22, 2011
ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles
Shin Muramoto, Jeremy Brison, David Castner
Analytical Chemistry
|
November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic films
Shin Muramoto, Jeremy Brison, David G Castner
Rapid Communications in Mass Spectrometry : RCM
|
July 20, 2007
Molecular depth-profiling of polycarbonate with low-energy Cs+ ions
Nicolas Mine, Bastien Douhard, Jeremy Brison, et al.
Applied Surface Science
|
February 1, 2014
COOH-terminated SAMs on gold fabricated from an azobenzene derivative with a 1,2-dithiolane headgroup
Ulrich Siemeling, Stefan Rittinghaus, Tobias Weidner, et al.
Biointerphases
|
November 26, 2025
Hydrolytic and enzymatic degradation of linear segmented polyurethane block copolymers studied by ToF-SIMS and atomic force microscopy
Gilad Zorn, Felix I Simonovsky, Jeremy Brison, et al.
Analytical Chemistry
|
November 22, 2011
Identifying individual cell types in heterogeneous cultures using secondary ion mass spectrometry imaging with C60 etching and multivariate analysis
Christopher A Barnes, Jeremy Brison, Michael Robinson, et al.
Surface and Interface Analysis : SIA
|
November 8, 2011
ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine
Jeremy Brison, Danielle S W Benoit, Shin Muramoto, et al.
Analytical Chemistry
|
October 18, 2013
TOF-SIMS 3D imaging of native and non-native species within HeLa cells
Jeremy Brison, Michael A Robinson, Danielle S W Benoit, et al.
Biomaterials
|
November 9, 2010
The surface molecular functionality of decellularized extracellular matrices
Christopher A Barnes, Jeremy Brison, Roger Michel, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 9) with videos related to
Sort By:
Page
of 1
Surface and Interface Analysis : SIA
|
October 22, 2011
ToF-SIMS Depth Profiling of Trehalose: The Effect of Analysis Beam Dose on the Quality of Depth Profiles
Shin Muramoto, Jeremy Brison, David Castner
Analytical Chemistry
|
November 17, 2011
Exploring the surface sensitivity of TOF-secondary ion mass spectrometry by measuring the implantation and sampling depths of Bi(n) and C60 ions in organic films
Shin Muramoto, Jeremy Brison, David G Castner
Rapid Communications in Mass Spectrometry : RCM
|
July 20, 2007
Molecular depth-profiling of polycarbonate with low-energy Cs+ ions
Nicolas Mine, Bastien Douhard, Jeremy Brison, et al.
Applied Surface Science
|
February 1, 2014
COOH-terminated SAMs on gold fabricated from an azobenzene derivative with a 1,2-dithiolane headgroup
Ulrich Siemeling, Stefan Rittinghaus, Tobias Weidner, et al.
Biointerphases
|
November 26, 2025
Hydrolytic and enzymatic degradation of linear segmented polyurethane block copolymers studied by ToF-SIMS and atomic force microscopy
Gilad Zorn, Felix I Simonovsky, Jeremy Brison, et al.
Analytical Chemistry
|
November 22, 2011
Identifying individual cell types in heterogeneous cultures using secondary ion mass spectrometry imaging with C60 etching and multivariate analysis
Christopher A Barnes, Jeremy Brison, Michael Robinson, et al.
Surface and Interface Analysis : SIA
|
November 8, 2011
ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine
Jeremy Brison, Danielle S W Benoit, Shin Muramoto, et al.
Analytical Chemistry
|
October 18, 2013
TOF-SIMS 3D imaging of native and non-native species within HeLa cells
Jeremy Brison, Michael A Robinson, Danielle S W Benoit, et al.
Biomaterials
|
November 9, 2010
The surface molecular functionality of decellularized extracellular matrices
Christopher A Barnes, Jeremy Brison, Roger Michel, et al.
Page
of 1