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Nano Letters|February 8, 2020
Chemical Identification of the Foremost Tip Atom in Atomic Force MicroscopyJo Onoda, Hiroki Miyazaki, Yoshiaki Sugimoto
Nature Communications|April 27, 2017
Electronegativity determination of individual surface atoms by atomic force microscopyJo Onoda, Martin Ondráček, Pavel Jelínek, et al.
ACS Nano|August 8, 2025
Electronic Control of Silicon Surface Atomic Structures with Two-Probe Scanning Tunneling MicroscopyJo Onoda, Lucian Livadaru, Robert A Wolkow, et al.
ACS Nano|November 15, 2021
Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling MicroscopeJo Onoda, Ali Khademi, Robert A Wolkow, et al.
Ultramicroscopy|November 10, 2018
Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperatureSimon Hettler, Jo Onoda, Robert Wolkow, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 14, 2014
(2<i>n</i> × 1) Reconstructions of TiO<sub>2</sub>(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling MicroscopyChi Lun Pang, Ayhan Yurtsever, Jo Onoda, et al.
Nanoscale|February 23, 2017
The local electronic properties of individual Pt atoms adsorbed on TiO<sub>2</sub>(110) studied by Kelvin probe force microscopy and first-principles simulationsAyhan Yurtsever, Delia Fernández-Torre, Jo Onoda, et al.
Small (Weinheim an Der Bergstrasse, Germany)|June 14, 2016
Effects of Pb Intercalation on the Structural and Electronic Properties of Epitaxial Graphene on SiCAyhan Yurtsever, Jo Onoda, Takushi Iimori, et al.
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