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Jo Verbeeck

Showing results (1-10 of 38) with videos related to

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Ultramicroscopy|January 1, 2013
Statistical consequences of applying a PCA noise filter on EELS spectrum imagesStijn Lichtert, Jo Verbeeck
Ultramicroscopy|July 28, 2007
Fringe contrast in inelastic LACBED holographyPeter Schattschneider, Jo Verbeeck
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 13, 2025
Retrieval of Phase Information from Low-Dose Electron Microscopy Experiments: Are We at the Limit Yet?Francisco Vega Ibáñez, Jo Verbeeck
Ultramicroscopy|June 14, 2011
A holographic biprism as a perfect energy filter?Jo Verbeeck, Giovanni Bertoni, Hannes Lichte
Ultramicroscopy|February 17, 2009
Image simulation of high resolution energy filtered TEM imagesJo Verbeeck, Peter Schattschneider, Andreas Rosenauer
Ultramicroscopy|November 27, 2007
The Fresnel effect of a defocused biprism on the fringes in inelastic holographyJo Verbeeck, Giovanni Bertoni, Peter Schattschneider
Microscopy Research and Technique|July 3, 2010
Fitting the momentum dependent loss function in EELSGiovanni Bertoni, Jo Verbeeck, Fons Brosens
Advanced Materials (Deerfield Beach, Fla.)|November 28, 2012
How to manipulate nanoparticles with an electron beam?Jo Verbeeck, He Tian, Gustaaf Van Tendeloo
Physical Review Letters|November 12, 2013
Transport of intensity phase retrieval of arbitrary wave fields including vorticesAxel Lubk, Giulio Guzzinati, Felix Börrnert, et al.
Ultramicroscopy|July 17, 2012
A holographic method to measure the source size broadening in STEMJo Verbeeck, Armand Béché, Wouter Van den Broek
Pageof 4

Showing results (1-10 of 38) with videos related to

Sort By:
Pageof 4
Ultramicroscopy|January 1, 2013
Statistical consequences of applying a PCA noise filter on EELS spectrum imagesStijn Lichtert, Jo Verbeeck
Ultramicroscopy|July 28, 2007
Fringe contrast in inelastic LACBED holographyPeter Schattschneider, Jo Verbeeck
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 13, 2025
Retrieval of Phase Information from Low-Dose Electron Microscopy Experiments: Are We at the Limit Yet?Francisco Vega Ibáñez, Jo Verbeeck
Ultramicroscopy|June 14, 2011
A holographic biprism as a perfect energy filter?Jo Verbeeck, Giovanni Bertoni, Hannes Lichte
Ultramicroscopy|February 17, 2009
Image simulation of high resolution energy filtered TEM imagesJo Verbeeck, Peter Schattschneider, Andreas Rosenauer
Ultramicroscopy|November 27, 2007
The Fresnel effect of a defocused biprism on the fringes in inelastic holographyJo Verbeeck, Giovanni Bertoni, Peter Schattschneider
Microscopy Research and Technique|July 3, 2010
Fitting the momentum dependent loss function in EELSGiovanni Bertoni, Jo Verbeeck, Fons Brosens
Advanced Materials (Deerfield Beach, Fla.)|November 28, 2012
How to manipulate nanoparticles with an electron beam?Jo Verbeeck, He Tian, Gustaaf Van Tendeloo
Physical Review Letters|November 12, 2013
Transport of intensity phase retrieval of arbitrary wave fields including vorticesAxel Lubk, Giulio Guzzinati, Felix Börrnert, et al.
Ultramicroscopy|July 17, 2012
A holographic method to measure the source size broadening in STEMJo Verbeeck, Armand Béché, Wouter Van den Broek
Pageof 4