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Sensors (Basel, Switzerland)|August 26, 2023
Exploring Digital Twin-Based Fault Monitoring: Challenges and OpportunitiesJherson Bofill, Mideth Abisado, Jocelyn Villaverde, et al.Sensors (Basel, Switzerland)|August 12, 2023
A Survey of Image-Based Fault Monitoring in Additive Manufacturing: Recent Developments and Future DirectionsRyanne Gail Kim, Mideth Abisado, Jocelyn Villaverde, et al.Pageof 1