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Joel C Weber

Showing results (1-10 of 9) with videos related to

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ACS Applied Materials & Interfaces|February 17, 2023
Effect of Geometry and Orientation on the Tensile Properties and Failure Mechanisms of Compliant Suture JointsAmir Darabi, Rong Long, Joel C Weber, et al.
Proceedings of Spie--The International Society for Optical Engineering|December 21, 2020
Core-shell <i>p-i-n</i> GaN nanowire LEDs by N-polar selective area growthMatt D Brubaker, Kristen L Genter, Joel C Weber, et al.
Nano Letters|January 28, 2015
Microwave near-field imaging of two-dimensional semiconductorsSamuel Berweger, Joel C Weber, Jimmy John, et al.
Advanced Materials (Deerfield Beach, Fla.)|March 23, 2023
Semiconductor Thermal and Electrical Properties Decoupled by Localized Phonon ResonancesBryan T Spann, Joel C Weber, Matt D Brubaker, et al.
Applied Physics Letters|March 15, 2024
Configurable error correction of code-division multiplexed TES detectors with a cryotron switchJoel C Weber, Joseph W Fowler, Malcolm Durkin, et al.
Nanotechnology|September 27, 2014
GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopyJoel C Weber, Paul T Blanchard, Aric W Sanders, et al.
IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee|May 9, 2022
Design of a 3000-Pixel Transition-Edge Sensor X-Ray Spectrometer for Microcircuit TomographyPaul Szypryt, Douglas A Bennett, William J Boone, et al.
The Review of Scientific Instruments|June 10, 2026
A superconducting transition edge sensor array for synchrotron soft x-ray emission spectroscopies of low-dimensional and impurity-level concentration systemsRégis Decker, Kelsey M Morgan, Sergey Peredkov, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor SpectrometerNathan Nakamura, Paul Szypryt, Amber L Dagel, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|February 17, 2023
Effect of Geometry and Orientation on the Tensile Properties and Failure Mechanisms of Compliant Suture JointsAmir Darabi, Rong Long, Joel C Weber, et al.
Proceedings of Spie--The International Society for Optical Engineering|December 21, 2020
Core-shell <i>p-i-n</i> GaN nanowire LEDs by N-polar selective area growthMatt D Brubaker, Kristen L Genter, Joel C Weber, et al.
Nano Letters|January 28, 2015
Microwave near-field imaging of two-dimensional semiconductorsSamuel Berweger, Joel C Weber, Jimmy John, et al.
Advanced Materials (Deerfield Beach, Fla.)|March 23, 2023
Semiconductor Thermal and Electrical Properties Decoupled by Localized Phonon ResonancesBryan T Spann, Joel C Weber, Matt D Brubaker, et al.
Applied Physics Letters|March 15, 2024
Configurable error correction of code-division multiplexed TES detectors with a cryotron switchJoel C Weber, Joseph W Fowler, Malcolm Durkin, et al.
Nanotechnology|September 27, 2014
GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopyJoel C Weber, Paul T Blanchard, Aric W Sanders, et al.
IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee|May 9, 2022
Design of a 3000-Pixel Transition-Edge Sensor X-Ray Spectrometer for Microcircuit TomographyPaul Szypryt, Douglas A Bennett, William J Boone, et al.
The Review of Scientific Instruments|June 10, 2026
A superconducting transition edge sensor array for synchrotron soft x-ray emission spectroscopies of low-dimensional and impurity-level concentration systemsRégis Decker, Kelsey M Morgan, Sergey Peredkov, et al.
Sensors (Basel, Switzerland)|May 11, 2024
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor SpectrometerNathan Nakamura, Paul Szypryt, Amber L Dagel, et al.
Pageof 1