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Journal of Applied Crystallography|October 10, 2024
Determining pair distribution functions of thin films using laboratory-based X-ray sourcesJohan Bylin, Vassilios Kapaklis, Gunnar K PálssonJournal of Applied Crystallography|June 3, 2026
GenL: an extensible fitting program for Laue oscillations and whole-pattern fittingAnna L Ravensburg, Johan Bylin, Vassilios Kapaklis, et al.Pageof 1