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Johan P M Hoefnagels

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The Journal of Chemical Physics|July 23, 2004
Absolute surface coverage measurement using a vibrational overtoneAndrew C R Pipino, Johan P M Hoefnagels, Noboru Watanabe
Ultramicroscopy|March 3, 2018
Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation frameworkSiavash Maraghechi, Johan P M Hoefnagels, Ron H J Peerlings, et al.
Micromachines|November 8, 2018
Ultra-Stretchable Interconnects for High-Density Stretchable ElectronicsSalman Shafqat, Johan P M Hoefnagels, Angel Savov, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
The Journal of Chemical Physics|July 23, 2004
Absolute surface coverage measurement using a vibrational overtoneAndrew C R Pipino, Johan P M Hoefnagels, Noboru Watanabe
Ultramicroscopy|March 3, 2018
Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation frameworkSiavash Maraghechi, Johan P M Hoefnagels, Ron H J Peerlings, et al.
Micromachines|November 8, 2018
Ultra-Stretchable Interconnects for High-Density Stretchable ElectronicsSalman Shafqat, Johan P M Hoefnagels, Angel Savov, et al.
Pageof 1