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Johannes J L Mulders

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2016
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping LayersDavid R Diercks, Brian P Gorman, Johannes J L Mulders
Langmuir : the ACS Journal of Surfaces and Colloids|March 15, 2012
Pattern shape control for heat treatment purification of electron-beam-induced deposition of gold from the Me2Au(acac) precursorAnastasia V Riazanova, Yuri G M Rikers, Johannes J L Mulders, et al.
Beilstein Journal of Nanotechnology|May 7, 2024
Sidewall angle tuning in focused electron beam-induced processingSangeetha Hari, Willem F van Dorp, Johannes J L Mulders, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 18, 2016
Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping LayersDavid R Diercks, Brian P Gorman, Johannes J L Mulders
Langmuir : the ACS Journal of Surfaces and Colloids|March 15, 2012
Pattern shape control for heat treatment purification of electron-beam-induced deposition of gold from the Me2Au(acac) precursorAnastasia V Riazanova, Yuri G M Rikers, Johannes J L Mulders, et al.
Beilstein Journal of Nanotechnology|May 7, 2024
Sidewall angle tuning in focused electron beam-induced processingSangeetha Hari, Willem F van Dorp, Johannes J L Mulders, et al.
Pageof 1