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John F Seely

Showing results (1-10 of 29) with videos related to

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Applied Optics|October 10, 2002
Extreme-ultraviolet thin-film interference in an Al-Mg-Al multiple-layer transmission filterJohn F Seely
The Review of Scientific Instruments|October 1, 2022
Hard x-ray spectrometer calibrations using a portable 120 kV x-ray sourceJohn F Seely
Optics Express|January 29, 2025
Color variations of silicon-on-insulator wafers with silicon device layer thicknessJohn F Seely
The Review of Scientific Instruments|July 10, 2021
Gigagauss magnetic field measurements using Zeeman broadening of Ne-like transitions in highly charged ionsJohn F Seely
Applied Optics|March 20, 2002
Efficiencies of master, replica, and multilayer gratings for the soft-x-ray-extreme-ultraviolet range: modeling based on the modified integral method and comparisons with measurementsLeonid I Goray, John F Seely
Applied Optics|March 11, 2004
Mo/B4C/Si multilayer-coated photodiode with polarization sensitivity at an extreme-ultraviolet wavelength of 13.5 nmBenjawan Kjornrattanawanich, Sasa Bajt, John F Seely
The Review of Scientific Instruments|June 3, 2016
Tunable hard X-ray spectrometer utilizing asymmetric planes of a quartz transmission crystalJohn F Seely, Albert Henins, Uri Feldman
Optics Letters|May 3, 2008
Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelengthBenjawan Kjornrattanawanich, David L Windt, John F Seely
Optics Letters|December 14, 2005
Response of a SiC photodiode to extreme ultraviolet through visible radiationJohn F Seely, Benjawan Kjornrattanawanich, Glenn E Holland, et al.
Applied Optics|May 15, 2002
Performance of normal-incidence molybdenum-yttrium multilayer-coated diffraction grating at a wavelength of 9 nmBenjawan Sae-Lao, Sasa Bajt, Claude Montcalm, et al.
Pageof 3

Showing results (1-10 of 29) with videos related to

Sort By:
Pageof 3
Applied Optics|October 10, 2002
Extreme-ultraviolet thin-film interference in an Al-Mg-Al multiple-layer transmission filterJohn F Seely
The Review of Scientific Instruments|October 1, 2022
Hard x-ray spectrometer calibrations using a portable 120 kV x-ray sourceJohn F Seely
Optics Express|January 29, 2025
Color variations of silicon-on-insulator wafers with silicon device layer thicknessJohn F Seely
The Review of Scientific Instruments|July 10, 2021
Gigagauss magnetic field measurements using Zeeman broadening of Ne-like transitions in highly charged ionsJohn F Seely
Applied Optics|March 20, 2002
Efficiencies of master, replica, and multilayer gratings for the soft-x-ray-extreme-ultraviolet range: modeling based on the modified integral method and comparisons with measurementsLeonid I Goray, John F Seely
Applied Optics|March 11, 2004
Mo/B4C/Si multilayer-coated photodiode with polarization sensitivity at an extreme-ultraviolet wavelength of 13.5 nmBenjawan Kjornrattanawanich, Sasa Bajt, John F Seely
The Review of Scientific Instruments|June 3, 2016
Tunable hard X-ray spectrometer utilizing asymmetric planes of a quartz transmission crystalJohn F Seely, Albert Henins, Uri Feldman
Optics Letters|May 3, 2008
Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelengthBenjawan Kjornrattanawanich, David L Windt, John F Seely
Optics Letters|December 14, 2005
Response of a SiC photodiode to extreme ultraviolet through visible radiationJohn F Seely, Benjawan Kjornrattanawanich, Glenn E Holland, et al.
Applied Optics|May 15, 2002
Performance of normal-incidence molybdenum-yttrium multilayer-coated diffraction grating at a wavelength of 9 nmBenjawan Sae-Lao, Sasa Bajt, Claude Montcalm, et al.
Pageof 3