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Jonas Fell

Showing results (1-10 of 5) with videos related to

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Materials (Basel, Switzerland)|April 14, 2026
Visualizing the 3D Evolution and Morphology of Hydrogen-Assisted Ductile Crack Growth in Hydrogen-Precharged P355NH Steel Using X-Ray Micro-Computed TomographyAlexander Hell, Jonas Fell, Torben Werning, et al.
Journal of Imaging|August 25, 2023
Target Design in SEM-Based Nano-CT and Its Influence on X-ray ImagingJonas Fell, Felix Wetzler, Michael Maisl, et al.
Materials (Basel, Switzerland)|January 21, 2023
Characterization of Filigree Additively Manufactured NiTi Structures Using Micro Tomography and Micromechanical Testing for Metamaterial Material ModelsThomas Straub, Jonas Fell, Simon Zabler, et al.
Journal of Synchrotron Radiation|February 20, 2026
Comparing image quality of synchrotron and laboratory nano-CT scans: a round robin studySimon Wittl, Simon Zabler, Jonas Fell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 8, 2022
A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries ResearchLuca Cressa, Jonas Fell, Christoph Pauly, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|April 14, 2026
Visualizing the 3D Evolution and Morphology of Hydrogen-Assisted Ductile Crack Growth in Hydrogen-Precharged P355NH Steel Using X-Ray Micro-Computed TomographyAlexander Hell, Jonas Fell, Torben Werning, et al.
Journal of Imaging|August 25, 2023
Target Design in SEM-Based Nano-CT and Its Influence on X-ray ImagingJonas Fell, Felix Wetzler, Michael Maisl, et al.
Materials (Basel, Switzerland)|January 21, 2023
Characterization of Filigree Additively Manufactured NiTi Structures Using Micro Tomography and Micromechanical Testing for Metamaterial Material ModelsThomas Straub, Jonas Fell, Simon Zabler, et al.
Journal of Synchrotron Radiation|February 20, 2026
Comparing image quality of synchrotron and laboratory nano-CT scans: a round robin studySimon Wittl, Simon Zabler, Jonas Fell, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 8, 2022
A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries ResearchLuca Cressa, Jonas Fell, Christoph Pauly, et al.
Pageof 1