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Jonathan Houard

Showing results (11-20 of 16) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2021
Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear MaterialsBenjamin Klaes, Rodrigue Lardé, Fabien Delaroche, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2026
Chromium- and Monolayer Graphene-Based Coating for THz-Assisted Atom Probe Tomography of Sol-Gel Silica SpecimensMatteo De Tullio, Florant Exertier, Ivan Blum, et al.
Ultramicroscopy|March 16, 2013
Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectivesLorenzo Rigutti, Angela Vella, François Vurpillot, et al.
Nano Letters|January 9, 2014
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN multiquantum well systemLorenzo Rigutti, Ivan Blum, Deodatta Shinde, et al.
ACS Omega|August 11, 2025
Role of Defects in Atom Probe Analysis of Sol-Gel SilicaGustav Eriksson, Matteo De Tullio, Francesco Carnovale, et al.
Nano Letters|November 25, 2020
Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom ProbeEnrico Di Russo, Pradip Dalapati, Jonathan Houard, et al.
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Showing results (11-20 of 16) with videos related to

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Pageof 2
You have reached the last page of results.This site can display upto 16 results.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 22, 2021
Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear MaterialsBenjamin Klaes, Rodrigue Lardé, Fabien Delaroche, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2026
Chromium- and Monolayer Graphene-Based Coating for THz-Assisted Atom Probe Tomography of Sol-Gel Silica SpecimensMatteo De Tullio, Florant Exertier, Ivan Blum, et al.
Ultramicroscopy|March 16, 2013
Coupling atom probe tomography and photoluminescence spectroscopy: exploratory results and perspectivesLorenzo Rigutti, Angela Vella, François Vurpillot, et al.
Nano Letters|January 9, 2014
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN multiquantum well systemLorenzo Rigutti, Ivan Blum, Deodatta Shinde, et al.
ACS Omega|August 11, 2025
Role of Defects in Atom Probe Analysis of Sol-Gel SilicaGustav Eriksson, Matteo De Tullio, Francesco Carnovale, et al.
Nano Letters|November 25, 2020
Super-resolution Optical Spectroscopy of Nanoscale Emitters within a Photonic Atom ProbeEnrico Di Russo, Pradip Dalapati, Jonathan Houard, et al.
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