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Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 15, 2026
Microscopic origins of electron trapping in amorphous silicon nitride (a-Si<sub>3</sub>N<sub>4</sub>) and its role in charge-trap flash memoryChristoph Wilhelmer, Lukas Hückmann, Jonathon Cottom, et al.
Small (Weinheim an Der Bergstrasse, Germany)|August 26, 2022
Investigating the Role of Surface Roughness and Defects on EC Breakdown, as a Precursor to SEI Formation in Hard Carbon Sodium-Ion Battery AnodesEmilia Olsson, Jonathon Cottom, Hande Alptekin, et al.
ACS Applied Materials & Interfaces|September 19, 2019
Modeling of Diffusion and Incorporation of Interstitial Oxygen Ions at the TiN/SiO<sub>2</sub> InterfaceJonathon Cottom, Anton Bochkarev, Emilia Olsson, et al.
Chemistry (Weinheim an Der Bergstrasse, Germany)|November 6, 2018
Filling a Niche in "Ligand Space" with Bulky, Electron-Poor Phosphorus(III) AlkoxidesSharifa Hussein, Denis Priester, Paul Beet, et al.
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