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Jonghyun Ko

Showing results (11-20 of 16) with videos related to

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Nature Communications|November 25, 2025
Harnessing chaotic bifurcation in positive feedback transistors for secure and scalable random key generationJiseong Im, Jonghyun Ko, Jisung Im, et al.
Nature Communications|July 27, 2025
Ferroelectric NAND for efficient hardware bayesian neural networksMinsuk Song, Ryun-Han Koo, Jangsaeng Kim, et al.
Nano Convergence|September 30, 2025
Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memorySung-Ho Park, Jiseong Im, Jonghyun Ko, et al.
Nature Communications|May 8, 2026
CMOS-compatible ferroelectric tunnel junctions integrate stochastic sampling and deterministic computing for image generationRyun-Han Koo, Jonghyun Ko, Wonjun Shin, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|September 26, 2024
Polarization Pruning: Reliability Enhancement of Hafnia-Based Ferroelectric Devices for Memory and Neuromorphic ComputingRyun-Han Koo, Wonjun Shin, Jangsaeng Kim, et al.
Nano Convergence|August 29, 2025
Physical correlation between stochasticity and process-induced damage in ferroelectric memory devicesRyun-Han Koo, Seungwhan Kim, Jiseong Im, et al.
Pageof 2

Showing results (11-20 of 16) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 16 results.
Nature Communications|November 25, 2025
Harnessing chaotic bifurcation in positive feedback transistors for secure and scalable random key generationJiseong Im, Jonghyun Ko, Jisung Im, et al.
Nature Communications|July 27, 2025
Ferroelectric NAND for efficient hardware bayesian neural networksMinsuk Song, Ryun-Han Koo, Jangsaeng Kim, et al.
Nano Convergence|September 30, 2025
Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memorySung-Ho Park, Jiseong Im, Jonghyun Ko, et al.
Nature Communications|May 8, 2026
CMOS-compatible ferroelectric tunnel junctions integrate stochastic sampling and deterministic computing for image generationRyun-Han Koo, Jonghyun Ko, Wonjun Shin, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|September 26, 2024
Polarization Pruning: Reliability Enhancement of Hafnia-Based Ferroelectric Devices for Memory and Neuromorphic ComputingRyun-Han Koo, Wonjun Shin, Jangsaeng Kim, et al.
Nano Convergence|August 29, 2025
Physical correlation between stochasticity and process-induced damage in ferroelectric memory devicesRyun-Han Koo, Seungwhan Kim, Jiseong Im, et al.
Pageof 2