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Optics Express
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May 23, 2009
Wide band interferometry for thickness measurement
Santiago Costantino, Oscar Martinez, Jorge Torga
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Search research articles
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Showing results (1-10 of 1) with videos related to
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Optics Express
|
May 23, 2009
Wide band interferometry for thickness measurement
Santiago Costantino, Oscar Martinez, Jorge Torga
Page
of 1