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Journal of Physics. Condensed Matter : an Institute of Physics Journal|August 19, 2016
Imaging of magnetic and electric fields by electron microscopyJosef ZweckUltramicroscopy|March 24, 2017
On the achievable field sensitivity of a segmented annular detector for differential phase contrast measurementsFelix Schwarzhuber, Peter Melzl, Josef ZweckUltramicroscopy|June 25, 2021
The differential phase contrast uncertainty relation: Connection between electron dose and field resolutionSimon Pöllath, Felix Schwarzhuber, Josef ZweckUltramicroscopy|July 5, 2016
On detector linearity and precision of beam shift detection for quantitative differential phase contrast applicationsJosef Zweck, Felix Schwarzhuber, Johannes Wild, et al.Ultramicroscopy|June 14, 2018
Introducing a non-pixelated and fast centre of mass detector for differential phase contrast microscopyFelix Schwarzhuber, Peter Melzl, Simon Pöllath, et al.Ultramicroscopy|April 4, 2003
Computer simulation of Lorentz electron micrographs of thin magnetic particlesThomas Haug, Stephan Otto, Markus Schneider, et al.Ultramicroscopy|May 20, 2023
Advanced processing of differential phase contrast data: Distinction between different causes of electron phase shiftsJosef Zweck, Felix Schwarzhuber, Simon Pöllath, et al.Chemistry (Weinheim an Der Bergstrasse, Germany)|January 10, 2018
Olefin-Stabilized Cobalt Nanoparticles for C=C, C=O, and C=N HydrogenationsSebastian Sandl, Felix Schwarzhuber, Simon Pöllath, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 3, 2012
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopyKnut Müller, Andreas Rosenauer, Marco Schowalter, et al.Physical Review Letters|December 31, 2005
Shifting and pinning of a magnetic vortex core in a permalloy dot by a magnetic fieldThomas Uhlig, M Rahm, Christian Dietrich, et al.Pageof 3