Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Joseph Vimal Vas

Showing results (1-10 of 8) with videos related to

Pageof 1
Sort By:
Beilstein Journal of Nanotechnology|January 12, 2024
TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranesJoshua Williams, Michael I Faley, Joseph Vimal Vas, et al.
Ultramicroscopy|May 17, 2025
Quantitative magnetic mapping in TEM through accurate 2D thickness determinationJoseph Vimal Vas, Hasan Ali, Wen Shi, et al.
ACS Applied Materials & Interfaces|August 22, 2020
Magnetoimpedance of Epitaxial Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (001) Thin Film in Low-Frequency RegimeRohit Medwal, Ushnish Chaudhuri, Joseph Vimal Vas, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 25, 2025
Enhancement of ferroelectric polarization in Sm-doped BaFe<sub>0.2</sub>Ti<sub>0.8</sub>O<sub>3</sub>ceramicsAnumeet Kaur, Arkaprava Das, Trilokchand L Kumavat, et al.
Ultramicroscopy|June 18, 2026
Towards reliable electrical measurements of superconducting devices inside a transmission electron microscopeJoachim Dahl Thomsen, Michael I Faley, Joseph Vimal Vas, et al.
Accounts of Chemical Research|August 2, 2021
Challenges and Applications to <i>Operando</i> and <i>In Situ</i> TEM Imaging and Spectroscopic Capabilities in a Cryogenic Temperature RangeElizaveta Tyukalova, Joseph Vimal Vas, Reinis Ignatans, et al.
Nature Communications|October 31, 2023
Additive manufacturing of alloys with programmable microstructure and propertiesShubo Gao, Zhi Li, Steven Van Petegem, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 12, 2024
Identifying the Origin of Thermal Modulation of Exchange Bias in MnPS<sub>3</sub>/Fe<sub>3</sub>GeTe<sub>2</sub> van der Waals HeterostructuresAravind Puthirath Balan, Aditya Kumar, Patrick Reiser, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Beilstein Journal of Nanotechnology|January 12, 2024
TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranesJoshua Williams, Michael I Faley, Joseph Vimal Vas, et al.
Ultramicroscopy|May 17, 2025
Quantitative magnetic mapping in TEM through accurate 2D thickness determinationJoseph Vimal Vas, Hasan Ali, Wen Shi, et al.
ACS Applied Materials & Interfaces|August 22, 2020
Magnetoimpedance of Epitaxial Y<sub>3</sub>Fe<sub>5</sub>O<sub>12</sub> (001) Thin Film in Low-Frequency RegimeRohit Medwal, Ushnish Chaudhuri, Joseph Vimal Vas, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|March 25, 2025
Enhancement of ferroelectric polarization in Sm-doped BaFe<sub>0.2</sub>Ti<sub>0.8</sub>O<sub>3</sub>ceramicsAnumeet Kaur, Arkaprava Das, Trilokchand L Kumavat, et al.
Ultramicroscopy|June 18, 2026
Towards reliable electrical measurements of superconducting devices inside a transmission electron microscopeJoachim Dahl Thomsen, Michael I Faley, Joseph Vimal Vas, et al.
Accounts of Chemical Research|August 2, 2021
Challenges and Applications to <i>Operando</i> and <i>In Situ</i> TEM Imaging and Spectroscopic Capabilities in a Cryogenic Temperature RangeElizaveta Tyukalova, Joseph Vimal Vas, Reinis Ignatans, et al.
Nature Communications|October 31, 2023
Additive manufacturing of alloys with programmable microstructure and propertiesShubo Gao, Zhi Li, Steven Van Petegem, et al.
Advanced Materials (Deerfield Beach, Fla.)|July 12, 2024
Identifying the Origin of Thermal Modulation of Exchange Bias in MnPS<sub>3</sub>/Fe<sub>3</sub>GeTe<sub>2</sub> van der Waals HeterostructuresAravind Puthirath Balan, Aditya Kumar, Patrick Reiser, et al.
Pageof 1