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Juequan Chen

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Optics Express|January 26, 2012
Ellipsometry with randomly varying polarization statesFeng Liu, Chris J Lee, Juequan Chen, et al.
Optics Express|September 23, 2009
Detection and characterization of carbon contamination on EUV multilayer mirrorsJuequan Chen, Eric Louis, Chris J Lee, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Optics Express|January 26, 2012
Ellipsometry with randomly varying polarization statesFeng Liu, Chris J Lee, Juequan Chen, et al.
Optics Express|September 23, 2009
Detection and characterization of carbon contamination on EUV multilayer mirrorsJuequan Chen, Eric Louis, Chris J Lee, et al.
Pageof 1