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Juergen Steininger

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The Review of Scientific Instruments|November 2, 2015
High bandwidth deflection readout for atomic force microscopesJuergen Steininger, Matthias Bibl, Han Woong Yoo, et al.
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The Review of Scientific Instruments|November 2, 2015
High bandwidth deflection readout for atomic force microscopesJuergen Steininger, Matthias Bibl, Han Woong Yoo, et al.
Pageof 1