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Analytical Chemistry|February 15, 2017
Large O2 Cluster Ions as Sputter Beam for ToF-SIMS Depth Profiling of Alkali Metals in Thin SiO2 FilmsSabine Holzer, Stefan Krivec, Sven Kayser, et al.
Scientific Reports|July 1, 2021
High resolution nanoscale chemical analysis of bitumen surface microstructuresAyse N Koyun, Julia Zakel, Sven Kayser, et al.
Analytical Chemistry|August 14, 2020
Multimodal Imaging Mass Spectrometry to Identify Markers of Pulmonary Arterial Hypertension in Human Lung Tissue Using MALDI-ToF, ToF-SIMS, and Hybrid SIMSSebastiaan Van Nuffel, Marceau Quatredeniers, Alexander Pirkl, et al.
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