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Julian Oberreiter

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Journal of Applied Crystallography|October 17, 2022
Faster and lower-dose X-ray reflectivity measurements enabled by physics-informed modeling and artificial intelligence co-refinementDavid Mareček, Julian Oberreiter, Andrew Nelson, et al.
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Journal of Applied Crystallography|October 17, 2022
Faster and lower-dose X-ray reflectivity measurements enabled by physics-informed modeling and artificial intelligence co-refinementDavid Mareček, Julian Oberreiter, Andrew Nelson, et al.
Pageof 1