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Langmuir : the ACS Journal of Surfaces and Colloids|April 20, 2005
Nanoscale patterning of alkyl monolayers on silicon using the atomic force microscopeJill E Headrick, Matt Armstrong, Justin Cratty, et al.
Chemical Communications (Cambridge, England)|November 2, 2005
AFM and STM characterization of thiol and thiophene functionalized SWNTs: pitfalls in the use of chemical markers to determine the extent of sidewall functionalization in SWNTsLei Zhang, Jun Zhang, Nicolaus Schmandt, et al.
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