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Journal of X-Ray Science and Technology|February 11, 2011
X-Ray Interferometry at ESRF Using Two Coherent Beams from Fresnel MirrorsK Fezzaa, F Comin, S Marchesini, et al.Applied Optics|March 18, 2008
X-ray interferometry of surfaces with Fresnel mirrorsS Marchesini, K Fezzaa, M Belakhovsky, et al.Journal of Synchrotron Radiation|May 16, 2006
Gauss-schell sources as models for synchrotron radiationR Coïsson, S MarchesiniThe Review of Scientific Instruments|November 1, 1978
Dynamic power supplies for TEA lasersR Coïsson, E RancanThe Review of Scientific Instruments|May 17, 2007
Invited article: a [corrected] unified evaluation of iterative projection algorithms for phase retrievalS MarchesiniPhysical Review Letters|October 15, 2008
Mechanical mode dependence of bolometric backaction in an atomic force microscopy microleverG Jourdan, F Comin, J ChevrierJournal of Synchrotron Radiation|August 7, 2001
Performance limits of indirectly cryogenically cooled silicon monochromators--experimental results at the APSW K Lee, K Fezzaa, P Fernandez, et al.Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|November 9, 2011
X-ray-induced water vaporizationB M Weon, J S Lee, J H Je, et al.Journal of Synchrotron Radiation|July 21, 2004
Trace element analysis on Si wafer surfaces by TXRF at the ID32 ESRF undulator beamlineL Ortega, F Comin, V Formoso, et al.Pageof 8