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K G Eyink

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IEEE Transactions on Neural Networks|January 1, 1996

Neural-net computing for interpretation of semiconductor film optical ellipsometry parametersG H Park, Y H Pao, B Igelnik, et al.

Journal of Microscopy|May 28, 2008

Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopyK Mahalingam, K G Eyink, G J Brown, et al.

Pageof 1

Search research articles

Showing results (1-10 of 2) with videos related to

Sort By:

Pageof 1

IEEE Transactions on Neural Networks|January 1, 1996

Neural-net computing for interpretation of semiconductor film optical ellipsometry parametersG H Park, Y H Pao, B Igelnik, et al.

Journal of Microscopy|May 28, 2008

Compositional analysis of mixed-cation-anion III-V semiconductor interfaces using phase retrieval high-resolution transmission electron microscopyK Mahalingam, K G Eyink, G J Brown, et al.

Pageof 1