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Journal of Microscopy|May 31, 2016
Nonlinear least squares regression for single image scanning electron microscope signal-to-noise ratio estimationK S Sim, S NorhishamJournal of Microscopy|August 21, 2015
Image signal-to-noise ratio estimation using adaptive slope nearest-neighbourhood modelK S Sim, V TehScanning|December 23, 2004
Image signal-to-noise ratio and noise variance estimation using autoregressive modelNidal S Kamel, K S SimJournal of Microscopy|February 24, 2005
New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEMK S Sim, J D WhiteScanning|July 31, 2004
Image signal-to-noise ratio estimation using the autoregressive modelK S Sim, Nidal S KamelScanning|May 14, 2015
Local dynamic range compensation for scanning electron microscope imaging systemK S Sim, Y H HuangJournal of Microscopy|July 7, 2005
Performance of a mixed Lagrange time delay estimation autoregressive (MLTDEAR) model for single-image signal- to-noise ratio estimation in scanning electron microscopyK S Sim, H T Chuah, C ZhengScanning|August 4, 2015
Adaptive noise Wiener filter for scanning electron microscope imaging systemK S Sim, V Teh, M E NiaScanning|June 16, 2016
Brain early infarct detection using gamma correction extreme-level eliminating with weighting distributionV Teh, K S Sim, E K WongScanning|December 23, 2004
Robust image signal-to-noise ratio estimation using mixed Lagrange time delay estimation autoregressive modelK S Sim, Zheng Cheng, H T ChuahPageof 15