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K S Vecchio

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Journal of Electron Microscopy Technique|March 1, 1991
Transmission electron microscope in situ fatigue experiments: a computer-control approachK S Vecchio, J A Hunt, D B Williams
The Review of Scientific Instruments|October 3, 2014
Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loadingP K Lambert, C J Hustedt, K S Vecchio, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Journal of Electron Microscopy Technique|March 1, 1991
Transmission electron microscope in situ fatigue experiments: a computer-control approachK S Vecchio, J A Hunt, D B Williams
The Review of Scientific Instruments|October 3, 2014
Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loadingP K Lambert, C J Hustedt, K S Vecchio, et al.
Pageof 1