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K Vedam

Showing results (1-10 of 25) with videos related to

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Optics Letters|October 2, 2009
Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometryP Chindaudom, K Vedam
Applied Optics|September 22, 2010
Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensatorP Chindaudom, K Vedam
Applied Optics|October 2, 2010
Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materialsP Chindaudom, K Vedam
Optics Letters|August 28, 2009
Direct observation of laser speckles for real-time analysis of lateral motionsC S Vikram, K Vedam
Applied Optics|June 15, 1986
Proper choice of the error function in modeling spectroellipsometric dataS Y Kim, K Vedam
Applied Optics|March 25, 2010
Stress-optic coefficient of ZnSe at 10.6 micromG R Mariner, K Vedam
Applied Optics|March 25, 2010
Speckle photography of lateral sinusoidal vibrations: error due to varying halo intensityC S Vikram, K Vedam
Applied Optics|March 4, 2010
Retroreflection from spherical glass beads in highway pavement markings. 1: Specular reflectionM D Stoudt, K Vedam
Applied Optics|March 10, 2010
Testing the trueness of circular surfaces by laser speckle photographyC S Vikram, K Vedam
Applied Optics|June 18, 2010
Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometryK Vedam, S Y Kim
Pageof 3

Showing results (1-10 of 25) with videos related to

Sort By:
Pageof 3
Optics Letters|October 2, 2009
Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometryP Chindaudom, K Vedam
Applied Optics|September 22, 2010
Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensatorP Chindaudom, K Vedam
Applied Optics|October 2, 2010
Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materialsP Chindaudom, K Vedam
Optics Letters|August 28, 2009
Direct observation of laser speckles for real-time analysis of lateral motionsC S Vikram, K Vedam
Applied Optics|June 15, 1986
Proper choice of the error function in modeling spectroellipsometric dataS Y Kim, K Vedam
Applied Optics|March 25, 2010
Stress-optic coefficient of ZnSe at 10.6 micromG R Mariner, K Vedam
Applied Optics|March 25, 2010
Speckle photography of lateral sinusoidal vibrations: error due to varying halo intensityC S Vikram, K Vedam
Applied Optics|March 4, 2010
Retroreflection from spherical glass beads in highway pavement markings. 1: Specular reflectionM D Stoudt, K Vedam
Applied Optics|March 10, 2010
Testing the trueness of circular surfaces by laser speckle photographyC S Vikram, K Vedam
Applied Optics|June 18, 2010
Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometryK Vedam, S Y Kim
Pageof 3