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Kamila Amato De Campos

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 14, 2013
Correlative fractography: combining scanning electron microscopy and light microscopes for qualitative and quantitative analysis of fracture surfacesLuis Rogerio de Oliveira Hein, José Alberto de Oliveira, Kamila Amato de Campos
Microscopy Research and Technique|July 2, 2013
Correlative light-electron fractography for fatigue striations characterization in metallic alloysLuis Rogerio de Oliveira Hein, José Alberto de Oliveira, Kamila Amato de Campos
Micron (Oxford, England : 1993)|May 19, 2012
Low voltage and variable-pressure scanning electron microscopy of fractured compositesLuis Rogerio de Oliveira Hein, Kamila Amato de Campos, Pietro Carelli Reis de Oliveira Caltabiano
Microscopy Research and Technique|July 19, 2012
Extended depth from focus reconstruction using NIH ImageJ plugins: quality and resolution of elevation mapsLuis Rogerio De Oliveira Hein, José Alberto De Oliveira, Kamila Amato De Campos, et al.
Microscopy Research and Technique|March 22, 2012
MRT letter: extended depth from focus reconstruction method for stretch zone measurement in 15-5PH steelPietro Carelli Reis De Oliveira Caltabiano, Paulo Henrique Santos Rosa, Kamila Amato De Campos, et al.
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Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 14, 2013
Correlative fractography: combining scanning electron microscopy and light microscopes for qualitative and quantitative analysis of fracture surfacesLuis Rogerio de Oliveira Hein, José Alberto de Oliveira, Kamila Amato de Campos
Microscopy Research and Technique|July 2, 2013
Correlative light-electron fractography for fatigue striations characterization in metallic alloysLuis Rogerio de Oliveira Hein, José Alberto de Oliveira, Kamila Amato de Campos
Micron (Oxford, England : 1993)|May 19, 2012
Low voltage and variable-pressure scanning electron microscopy of fractured compositesLuis Rogerio de Oliveira Hein, Kamila Amato de Campos, Pietro Carelli Reis de Oliveira Caltabiano
Microscopy Research and Technique|July 19, 2012
Extended depth from focus reconstruction using NIH ImageJ plugins: quality and resolution of elevation mapsLuis Rogerio De Oliveira Hein, José Alberto De Oliveira, Kamila Amato De Campos, et al.
Microscopy Research and Technique|March 22, 2012
MRT letter: extended depth from focus reconstruction method for stretch zone measurement in 15-5PH steelPietro Carelli Reis De Oliveira Caltabiano, Paulo Henrique Santos Rosa, Kamila Amato De Campos, et al.
Pageof 1