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Karl Hujsak

Showing results (1-10 of 4) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2016
Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine LearningKarl Hujsak, Benjamin D Myers, Eric Roth, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 20, 2015
Mesophase in a thiolate-containing diacyl phospholipid self-assembled monolayerWangqiang Sun, Sumit Kewalramani, Karl Hujsak, et al.
ACS Nano|February 6, 2018
Micromachined Chip Scale Thermal Sensor for Thermal ImagingGajendra S Shekhawat, Srinivasan Ramachandran, Hossein Jiryaei Sharahi, et al.
Scientific Reports|September 20, 2017
Rapid alignment of nanotomography data using joint iterative reconstruction and reprojectionDoğa Gürsoy, Young P Hong, Kuan He, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 27, 2016
Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine LearningKarl Hujsak, Benjamin D Myers, Eric Roth, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 20, 2015
Mesophase in a thiolate-containing diacyl phospholipid self-assembled monolayerWangqiang Sun, Sumit Kewalramani, Karl Hujsak, et al.
ACS Nano|February 6, 2018
Micromachined Chip Scale Thermal Sensor for Thermal ImagingGajendra S Shekhawat, Srinivasan Ramachandran, Hossein Jiryaei Sharahi, et al.
Scientific Reports|September 20, 2017
Rapid alignment of nanotomography data using joint iterative reconstruction and reprojectionDoğa Gürsoy, Young P Hong, Kuan He, et al.
Pageof 1